Join Cranfield the UK & I FIB ToF-SIMS Network for a one-day, in-person workshop at University on 27 April 2026, co-organised by Cranfield University and Tescan UK. The day combines short presentations covering technology, theory, and practical applications of FIB-based ToF-SIMS, followed by an afternoon of hands-on sessions using a live FIB ToF-SIMS system. You’ll also get guided support on data processing software and practical help solving real data challenges.

Come along for a fantastic opportunity to learn more about this technique, network with researchers and technical specialists from the instrument manufacturers, academia and industry.

Anyone with an interest or potential interest in FIB ToFSIMS is very welcome to attend, there is no cost to attend this event, we just ask that you register your interest, a light buffet lunch and refreshments will be provided.

Event Programme

To be released soon….

Location and travel details

Cranfield University, Building 38, The Gallery

Who should attend

Researchers and staff planning future research projects involving materials analysis. Anyone with an interest in or potential interest in the application of FIB based ToFSIMS in their research.

Cost

Free to attend

How to register

Register here.