Contact Dr Jafar Jamshidi

Areas of expertise

Background

Dr Jafar Jamshidi (MSc MBA PhD CEng IMechE FCMI) started working as a tool making apprentice in ITMC (a Siemens subsidiary) in 1986. He has 15 years’ work experience in industry, and 15 years in academia doing R&D in mechanical design, metrology, and manufacturing related topics. His industrial clients include: Airbus, Rolls Royce, Vestas Blades, BAE Systems, ITER organisation, Renishaw, FARO, Hexagon, EADS Astrium, National Physical Laboratory, Jaguar Land Rover, Tata Motors, among others. His current teaching involves using CAD/CAM for aircraft design applications.

Publications

Articles In Journals

Conference Papers

  • Guo Y, Cai B, Jamshidi J & Maropoulos P (2008) A large volume metrology process model for integrating design and manufacturing. In: 5th International Conference on Digital Enterprise Technology: DET2008, Nantes, France, 22-24 October 2008.
  • Cai B, Guo Y, Jamshidi J & Maropoulos P (2008) Large volume measurability analysis for early design. In: 5th International Conference on Digital Enterprise Technology: DET2008, Nantes, France, 22-24 October 2008.
  • Jamshidi J, Mileham A & Owen G (2006) Dimensional tolerance approximation for reverse engineering applications. In: 9th International Design Conference: DESIGN 2006, Dubrovnik, 15-18 May 2006.
  • Jamshidi J, Mileham A & Owen G (2006) High accuracy laser scanned view registration method for reverse engineering using a CMM generated CAD model. In: ASME Design Engineering Technical Conference, Philadelphia, 10-13 September 2006.

Books

  • Ferri C, Jamshidi J, Loftus C & Maropoulos P (2010) Design of an information system for metrology contents. Springer Verlag.
  • Muelaner J, Wang Z, Jamshidi J & Maropoulos P (2010) Verification of the indoor GPS system by comparison with points calibrated using a network of laser tracker measurements. Springer Verlag.
  • Dai W, Maropoulos P, Tang X, Jamshidi J & Cai B (2010) Measurement resource planning: A methodology that uses quality characteristics mapping. Springer Verlag.