Short course/CPD
Metrology and Optical Testing
Course date: Please enquire
Course overview
Metrology is the key enabling technology for ultra precision technologies - “If you can’t measure it, you can’t make it”.
Cranfield University and Technium OpTIC (Opto-electronics Technology and Incubation Centre) offer this five day introductory short course in metrology and optical testing which aims to provide the basic science and practice behind the characterisation and measurement of functional surfaces, with a special focus on optical surfaces.
Who should attend?
- Engineers working in the machine tool, automotive, aerospace, optics, optoelectronics and semiconductor industries
- Individuals involved in high value precision engineering where accuracy is critical to profitability and success.
Benefits of attending
On successful completion of this course, delegates will be able to:
- Demonstrate critical awareness of the fundamental science for the systematic application of measurement.
- Critically evaluate component geometry specifications.
- Critically evaluate and specify metrology requirements for functional surfaces.
- Demonstrate conceptual thinking for the identification of appropriate task specific measurement procedures in a range of applications.
- Demonstrate critical awareness of current research and performance capabilities for the selection and use of displacement measurement technologies.
Location
Course fee:
- £1400 - Standard. 20% discount for Cranfield alumni, 10% discount for colleagues of alumni
- £1340 - Professional/trade association discount
- £1280 - Multiple bookings*
*Minimum of five delegates.
Accommodation fee:
Accommodation is not included in the price.
Speakers
Senior Research Engineer at Cranfield with extensive industrial experience within the precision machine tool sector. Specialisms include metrology, machine tool calibration and process development.
John Mitchell
An applied physicist with a PhD in optical metrology, Dr Mitchell has experience in modern and applied optics, classical, holographic and speckle interferometry and holography.
Mr Paul Morantz
Principal Research Fellow at Cranfield. Paul has an exceptional record in the fields of precision motion control, precision metrology and machine tool development.
Dr Chris Sansom
Senior Lecturer in Ultra Precision Engineering and Course Director of the MSc Ultra Precision Technologies at Cranfield. Chris has considerable industrial experience in a range of of technologies including semiconductor materials growth, materials assessment and analysis, materials processing, and component fabrication and test.
How to register
To request a place on this course, please complete the online Registration Form.
If you have any queries please contact:
Cranfield University
Cranfield
Bedfordshire
MK43 0AL, UK
T: +44 (0) 1234 754176
E: shortcourse@cranfield.ac.uk
F: +44 (0) 1234 751206
Please be aware that short courses/CPD are subject to:
Booking ConditionsCourse description
- The purpose, science and philosophy of measurement
- Interferometry and optical testing of surface form
- The characterisation of surface texture
- Contact and non-contact measurement of dimension and geometry
- Measurement of displacement.
This short course is also a module associated with a Masters-level programme. For further information please click on the programme title directly above in the Quick navigation box.
