Dr Glenn Leighton
Research Fellow in Microsystems and Nanotechnology
Location: Building 70, Cranfield campus
E: g.j.t.leighton@cranfield.ac.uk
T: +44 (0)1234 750111 x2583
Manufacturing and Materials
Current activities
Dr Glenn Leighton is currently working as a Research Fellow at Cranfield University in the field of materials science position since 2007. The research he is undertaking is aimed at the characterisation of the material properties of thin and thick film piezoelectrics.
Background
Dr Glenn Leighton was born in Doncaster, England, in 1970. He received his HND in electronics and advanced computing technology from Doncaster College in 2000, and a BSc degree in Integrated Technology from Hull University in 2001. After completing an MSc at Cranfield University in Microsystems and Nanotechnology in 2003 he stayed on at Cranfield University as a PhD student working on RF MEMS devices. Upon completion he took a position as Research Officer developing new characterisation methods for the properties of piezoelectric materials. His research skills lie in the use of laser scanning vibrometry, electronics, FEA modelling and fabrication/design of devices.
Selected publications
- Zhu, M., Leighton, G., Kirby, P., (2008), ‘Are the generally used 1D and 2D constitutive equations for piezoelectric materials correct?’, IEEE T ULTRASON FERR. (In Press)
- Pomeroy, J. W. Gkotsis, P. Zhu, M. Leighton, G. Kirby, P. and Kuball, M. (2008). Dynamic operational stress measurement of MEMS using time-resolved Raman spectroscopy, J MICROELECTROMECH S. (In Press)
- Leighton, G.J.T., Kirby, P.B. and Fox, C.H.J. (2007), ‘In-plane excitation of thin silicon cantilevers using piezoelectric thin films’, APPL PHYS LETT. 91, 18, 183510
- Huang, Z., Leighton, G., Wright, R., Duval, F., Chung, H.C., Kirby, P. and Whatmore, R.W. (2007), 'Determination of piezoelectric coefficients and elastic constant of thin films by laser scanning vibrometry techniques', SENSOR ACTTUAT A-PHYS, Vol. 135, No. 2, pp. 660-665.
- Huang, Z., Zhang, Q., Corkovic, S., Dorey, R., Duval, F., Leighton, G., Wright, R., Kirby, P. and Whatmore, R. (2006), 'Piezoelectric PZT films for MEMS and their characterization by interferometry',J ELECTROCERAM, Vol. 17, No. 2, pp. 549-556.
