Mr Petros Gkotsis
Piezoelectric Process and Design Engineer
Location: Building 70, Cranfield campus
E: p.gkotsis@cranfield.ac.uk
T: +44 (0)1234 750111 x2583
Materials
Current activities
- tensile testing of ferroelectric-piezoelectric thin film materials
- dynamic crack growth studies in thin film ferroelecrics
- residual and operational stresses in piezo MEMS devices.
Clients
- EU sixth Framework Programme
Background
Petros Gkotsis received a degree in Physics from the National and Kapodistrian University of Athens, Athens, Greece, in 2004, and attended an MSc course in Chemical Engineering at the University of Patras, Patras, Greece, until 2006. In March 2006 he joined the Materials Department at Cranfield University for his PhD studies on the reliability of MEMS structures.
Selected publications
- Thin film crystal growth template removal: Application to stress reduction in lead zirconate titanate microstructures. P. Gkotsis, P. B. Kirby, F. Saharil, J. Oberhammer, G. Stemme. Applied Physics Letters, vol. 91, issue 16, 2007.
- Dynamic Operational Stress Measurement of MEMS using Time Resolved Raman Spectroscopy. J.W. Pomeroy, P. Gkotsis, M. Zhu, P. Kirby, and M. Kuball. IEEE/ ASME Journal of Microelectromechanical Systems, vol.17 issue 6, 2008.
- Platinum bottom electrode and thin film PZT observations following wafer transfer. P. Gkotsis, G. Leighton, D. Bhattacharyya, R. V. Wright, M. Zhu, P. B. Kirby, F. Saharil, J. Oberhammer, G. Stemme. Poster Presentation in ISIF 2007 conference in Bordeaux.
